Protection circuit for a semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure – Plural non-isolated transistor structures in same structure

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257565, 257557, 257370, 257546, 257355, 257382, H01L 27082, H01L 2900, H01L 27102, H01L 2970

Patent

active

060491191

ABSTRACT:
A semiconductor device having a substrate with a first conductivity type. The substrate has a top substrate region that also has the first conductivity type. A first doped region, a second doped region and a third doped region are located in the top substrate region where the first and second doped regions have a second conductivity type opposite the first conductivity type while the third doped region has the first conductivity type and where the third doped region is between the first and second doped regions. A doped well region is also in the top substrate region and has the second conductivity type and has the second doped region and at least a portion of the third doped region located therein. A method of forming the device is also provided herein.

REFERENCES:
patent: 5060044 (1991-10-01), Tomassetti
patent: 5119160 (1992-06-01), Hall
patent: 5166089 (1992-11-01), Chen et al.
patent: 5218228 (1993-06-01), Williams et al.
patent: 5219784 (1993-06-01), Solheim
patent: 5465189 (1995-11-01), Polgreen et al.
patent: 5504368 (1996-04-01), Sawada
patent: 5530612 (1996-06-01), Maloney
patent: 5539327 (1996-07-01), Shigehara et al.
patent: 5602404 (1997-02-01), Chen et al.
patent: 5635746 (1997-06-01), Kimura et al.
patent: 5726844 (1998-03-01), Smith
patent: 5742084 (1998-04-01), Yu
Amerasekera et al.; "Substrate Triggering and Salicide Effects on ESD Performance and Protection Circuit Design in Deep Submicron CMOS Processes;" IEDM 95; pp. 547-550 (1995).
Voldman et al.; "Analysis of Snubber-Clamped Diode-String Mixed Voltage Interface ESD Protection Network for Advanced Microprocessors;" EOS/ESD Symposium 95; pp. 43-61 (1995).
Tandan; "ESD Trigger Circuit;" EOS/ESD Symposium 94 (1994).
"A Subtrate Triggered Lateral Bipolar Circuit for High Voltage Tolerant ESD Protection Applications," Jeremy C. Smith.
"EOS/ESD Analysis of High-Density Logic Chips", Ramaswamy, et al.; EOS/ESD Symposium 96; pp.285-290.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Protection circuit for a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Protection circuit for a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Protection circuit for a semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1178729

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.