Projection exposure apparatus and projection exposure method

Optics: measuring and testing – By polarized light examination – With light attenuation

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Details

356400, 356363, 2505593, 250548, G01B 1114

Patent

active

060942681

ABSTRACT:
A projection exposure apparatus (1) comprises an incident light optical system for causing the light emitted from a light source 1 to enter an object of exposure (4) in diagonal direction, a detection apparatus (3) for causing an interference between the light reflected from the object of exposure (4) and a reference light and detecting the resultant interference fringe, a processing circuit for determining the inclination and height of the surface of the object of exposure (4) from the optical information on the interference fringe, and a stage (7) for supporting the object of exposure (4). The object of exposure (4) is subjected to projection exposure by driving the stage (7) according to the calculated inclination and height of the object of exposure (4).

REFERENCES:
patent: 2911880 (1959-11-01), Rantsch
patent: 3601490 (1971-08-01), Erickson
patent: 4013366 (1977-03-01), Philbert
patent: 4207467 (1980-06-01), Doyle
patent: 4356392 (1982-10-01), Wittekoek et al.
patent: 4558949 (1985-12-01), Uehara et al.
patent: 4626103 (1986-12-01), Feldman et al.
patent: 4704020 (1987-11-01), Nurakami et al.
patent: 4704033 (1987-11-01), Fay et al.
patent: 4744659 (1988-05-01), Kitabayashi
patent: 4866262 (1989-09-01), Van der Werg et al.
patent: 4902900 (1990-02-01), Kamiya et al.
patent: 5118957 (1992-06-01), Kawashima et al.
patent: 5124562 (1992-06-01), Kawashima et al.
patent: 5162642 (1992-11-01), Akamatsu et al.
patent: 5216235 (1993-06-01), Lin
patent: 5218415 (1993-06-01), Kawashima
IBM Technical Disclosure Bulletin, vol. 24, No. 1B, Jun. 1981, pp. 541-542, "Evaluation of sinusoidally varying light signals".
Soviet Patent Abstracts, Mar. 29, 1989, p. 11, AN=89-052538107, Derwent Pub., London, GB; and SU-A-1413 547 (Voron Poly (NYVO)) Jul. 30, 1988.

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