Electrical computers and digital data processing systems: input/ – Input/output data processing – Peripheral adapting
Reexamination Certificate
2008-01-09
2011-12-06
Tsai, Henry (Department: 2184)
Electrical computers and digital data processing systems: input/
Input/output data processing
Peripheral adapting
Reexamination Certificate
active
08073996
ABSTRACT:
The present invention provides a programmable modular circuit for testing and controlling a system-on-a-chip integrated circuit, and applications thereof. In an embodiment, the programmable modular circuit comprises a plurality of serial-to-parallel interface registers coupled together by a data line, a clock line, and an enable line. Each of the plurality of serial-to-parallel interface registers is coupled to a module of the system-on-a-chip. The data line and the clock line are used to serially clock data into the plurality of serial-to-parallel interface registers. Applying a first logical value to the enable line provides the data serially clocked into the plurality of serial-to-parallel interface registers to modules of the system-on-a-chip. Applying a second logical value to the enable line provides default values to modules of the system-on-a-chip. The data values serially clocked into the plurality of serial-to-parallel interface registers can be used to test and/or to modify selected operating characteristics of the system-on-a-chip.
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Bever Hoffman & Harms LLP
Harms Jeanette S.
Oberly Eric
Synopsys Inc.
Tsai Henry
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