Programmable logic device and method of testing

Details Programmable logic device and method of testing Programmable logic device and method of testing

2008-12-03

2010-02-02

Chang, Daniel D (Department: 2819)

Electronic digital logic circuitry

Multifunctional or programmable

Array

C326S038000, C326S046000

Reexamination Certificate

active

07656193

ABSTRACT:
In one embodiment of the invention, a programmable logic device includes a plurality of programmable resources; non-volatile configuration memory adapted to store configuration data for configuring the plurality of programmable resources; a register adapted to load configuration data into the non-volatile configuration memory; and test circuitry coupled to the register. The test circuitry is adapted to configure a programmable resource with test data stored in the register rather than with configuration data stored in the non-volatile configuration memory. In another embodiment of the invention, the programmable logic device includes a buffer coupled between the configuration memory and a programmable resource, and the test circuitry includes a logic circuit coupled between the register, the configuration memory, and the buffer. The logic circuit is responsive to a test mode signal to route test data from the register to the buffer.

REFERENCES:
patent: 6097211 (2000-08-01), Couts-Martin et al.

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