Programmable logic device and method of testing

Details Programmable logic device and method of testing Programmable logic device and method of testing

2006-06-13

2008-12-09

Chang, Daniel D (Department: 2819)

Electronic digital logic circuitry

Multifunctional or programmable

Array

C326S038000, C326S046000

Reexamination Certificate

active

07463060

ABSTRACT:
A programmable logic device may comprise a plurality of programmable resources and non-volatile configuration memory to store configuration data by which to configure the programmable resources. Test override circuitry may determine a test mode and selectively override the configuration data stored in the non-volatile configuration memory during the test mode for configuring the programmable resources based at least in part on test configuration data other than the configuration data stored in the non-volatile memory. A buffer may be operable to drive a configuration select node for at least one of the programmable resources for designating a configuration therefore based on the configuration data of the non-volatile memory. The test override circuitry may comprise a pull-down circuit operable, when enabled dependent on the test configuration data, to drive the buffer with a high/low level capable of overriding a state of the non-volatile configuration memory.

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