Programmable integrated circuit having test antifuse circuitry f

Details Programmable integrated circuit having test antifuse circuitry f Programmable integrated circuit having test antifuse circuitry f

1997-09-17

1999-09-21

Santamauro, Jon

Electronic digital logic circuitry

Multifunctional or programmable

Array

326 39, H03K 19177

Patent

active

059558920

ABSTRACT:
In a programmable integrated circuit such as a field programmable gate array (see FIG. 6), a programming driver is coupled to one end of a programming conductor and a test transistor/test antifuse structure is coupled to the other end of the programming driver. To test the continuity of the programming conductor, the test transistor is controlled to be conductive. If the programming driver can drive an adequately large amount of programming current through the length of the programming conductor to the conductive test transistor and the test antifuse such that the test antifuse programs, then it is determined that the programming conductor has adequate continuity. In some embodiments a second test transistor that should be permanently nonconductive is disposed in parallel with the test antifuse.

REFERENCES:
patent: 4439804 (1984-03-01), Riddle et al.
patent: 5196724 (1993-03-01), Gordon et al.
patent: 5220213 (1993-06-01), Chan et al.
patent: 5302546 (1994-04-01), Gordon et al.
patent: 5336986 (1994-08-01), Allman
patent: 5347519 (1994-09-01), Cooke et al.
patent: 5391942 (1995-02-01), El-Ayat et al.
patent: 5416367 (1995-05-01), Chan et al.
patent: 5424655 (1995-06-01), Chua
patent: 5495181 (1996-02-01), Kolze
patent: 5502315 (1996-03-01), Chua et al.
patent: 5544070 (1996-08-01), Cox et al.
patent: 5557136 (1996-09-01), Gordon et al.
S. Brown, et al., "Field Programmable Gate Arrays", pp. 1-43 and 88-202 (1992). No month.
S. Trimberger, "Field Programmable Gate Array Technology", pp. 1-14 and 98-170 (1994). No Month.
D. Pellerin, et al., "Practical Design Using Programmable Logic", pp. 84-98 (1991). No Month.
Xilinx, "The Programmable Gate Array Design Hand Book", First Edition, pp. 1-9 through 2-73 (1986). No Month.

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