Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2006-06-27
2006-06-27
Brewster, William M. (Department: 2823)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S702000, C438S703000, C438S725000, C438S734000
Reexamination Certificate
active
07067429
ABSTRACT:
A method of forming integrated circuitry includes chemical vapor depositing a silicon carbide comprising layer over a substrate at a temperature of no greater than 500° C. Plasma etching is conducted through at least a portion of the silicon carbide comprising layer using a gas chemistry comprising oxygen and hydrogen. Semiconductor processing methods include the above in fabrication of contact openings and in fabrication of MRAM circuitry. Semiconductor processing methods also include fabrication of contact openings using resist and removing silicon carbide comprising material and resist in a common plasma etching step.
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Hineman Max F.
Li Li
Tuttle Mark E.
Brewster William M.
Micro)n Technology, Inc.
Wells St. John P.S.
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