Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Patent
1980-12-23
1982-12-14
Smith, John D.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
156653, 156657, 427 39, 427 93, 427 94, 427 95, 430316, 430317, H01L 21318
Patent
active
043638686
ABSTRACT:
A selective oxidation process for producing a semiconductor device comprises the step of depositing a silicon oxynitride layer directly on a silicon substrate by a plasma chemical vapor deposition method. After a selective oxidation of the silicon substrate, the silicon oxynitride layer is removed.
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Morosanu et al., "Thin Film Preparation by Plasma and Low Pressure CVD in a Horizontal Reactor", Vacuum, vol. 31, No. 7, pp. 309-313, 1981.
Maeda Mamoru
Takasaki Kanetake
Fujitsu Limited
Smith John D.
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