Process of forming inter-level connection without increase of co

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438637, 438658, 438659, 438672, H01L 214763

Patent

active

059306750

ABSTRACT:
A natural oxide on an amorphous silicon exposed to a miniature contact hole is thermally decomposed in vacuum and an amorphous silicon is grown on the amorphous silicon without exposing to the atmosphere; the amorphous silicon is applied with heat so as to be epitaxially grown on a single crystal silicon beneath the amorphous silicon, thereby forming a conductive plug in the miniature contact hole.

REFERENCES:
patent: 4843034 (1989-06-01), Hetndon et al.
patent: 5418180 (1995-05-01), Brown

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process of forming inter-level connection without increase of co does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process of forming inter-level connection without increase of co, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process of forming inter-level connection without increase of co will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-891902

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.