Coating processes – Direct application of electrical – magnetic – wave – or... – Plasma
Patent
1999-04-12
2000-12-26
Diamond, Alan
Coating processes
Direct application of electrical, magnetic, wave, or...
Plasma
20419211, 20419225, 20419212, 2041921, 20419217, 20419216, 20429812, 20429811, 20429806, 20429802, 427569, 427580, 427123, 427124, 4271261, 427526, 427527, 427531, 438758, 438584, 438579, C23C 1434, C23C 1448
Patent
active
061655678
ABSTRACT:
A film is formed over a substrate using a physical vapor deposition method. When using ionized metal plasma physical vapor deposition, the deposition chamber configuration or operating parameters are adjusted to achieve the desired film characteristics. If the film is to be substantially uniform in thickness across a substrate, the deposition species density is made higher at locations away from the center of the substrate.
REFERENCES:
patent: 4500409 (1985-02-01), Boys et al.
patent: 4564435 (1986-01-01), Wickersham
patent: 4606806 (1986-08-01), Helmer
patent: 4627904 (1986-12-01), Mintz
patent: 4761218 (1988-08-01), Boys
patent: 4842703 (1989-06-01), Class et al.
patent: 5061360 (1991-10-01), Clarke
patent: 5135634 (1992-08-01), Clarke
patent: 5194131 (1993-03-01), Anderson
patent: 5302266 (1994-04-01), Grabarz et al.
patent: 5314597 (1994-05-01), Harra
patent: 5340459 (1994-08-01), Takehara
patent: 5417833 (1995-05-01), Harra et al.
patent: 5593551 (1997-01-01), Lai
patent: 5683548 (1997-11-01), Hartig et al.
patent: 5707498 (1998-01-01), Ngan
patent: 5711812 (1998-01-01), Chapek et al.
patent: 5800688 (1998-09-01), Lantsman et al.
patent: 5830272 (1998-11-01), Begin et al.
patent: 5902461 (1999-05-01), Xu et al.
patent: 5968327 (1999-10-01), Kobayashi et al.
patent: 5976327 (1999-11-01), Tanaka
Hajzak, "Practical Techniques for Improving Sputtered Film Quality," J. Vacuum Sci, Technol., 7(1), pp. 224-227, Jan. 1970.
Rossnagel, "Directional and ionized physical vapor deposition for microelectronics applications," Review Article, American Vacuum Society, pp. 2585-2607 (1998) (month unknown).
Yamada et al., "Model for a large area multi-frequency multiplanar coil inductively coupled plasma source," Journal of Vacuum Science and Technology A, American Institute of Physics, JVST A Second Series, vol. 14, No. 5, pp. 2859-2870 Sep./Oct., 1996.
Ventzek et al., "Simulations of real-time control of two-dimensional features in inductively coupled plasma sources for etching applications," American Vacuum Society, pp. 2456-2463 Sep./Oct., 1995.
"Physics and Chemistry of Protective Coatings," American Institute of Physics, Conference Proceedings No. 149, American Vacuum Society Series 2, pp. 62-78 (1986) (month unknown).
Arnold John C.
Coronell Daniel G.
Hartig Michael J.
Ventzek Peter Lowell George
Diamond Alan
Motorola Inc.
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