Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Patent
1996-12-27
1999-04-06
Bowers, Charles
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
438787, H01L 2131, H01L 21469
Patent
active
058918108
ABSTRACT:
A method and apparatus for controlling the amount of ozone concentration in the layers of a film depositing system and the multi-layered structure produced thereby, whereby the concentration of ozone in each layer gradually changes from a low ozone concentration in the first deposited layer to a high ozone concentration in the last deposited layer.
REFERENCES:
patent: 5288518 (1994-02-01), Homma
patent: 5632868 (1997-05-01), Harada et al.
Kim Yun-Hee
Park Nae-Hak
Song Young-Jin
Bowers Charles
LG Semicon Co. Ltd.
Thompson Craig
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