Process for supplying ozone (O.sub.3) to TEOS-O.sub.3 oxidizing

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

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438787, H01L 2131, H01L 21469

Patent

active

058918108

ABSTRACT:
A method and apparatus for controlling the amount of ozone concentration in the layers of a film depositing system and the multi-layered structure produced thereby, whereby the concentration of ozone in each layer gradually changes from a low ozone concentration in the first deposited layer to a high ozone concentration in the last deposited layer.

REFERENCES:
patent: 5288518 (1994-02-01), Homma
patent: 5632868 (1997-05-01), Harada et al.

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