Etching a substrate: processes – Gas phase etching of substrate – Etching inorganic substrate
Reexamination Certificate
2006-10-31
2006-10-31
Norton, Nadine (Department: 1765)
Etching a substrate: processes
Gas phase etching of substrate
Etching inorganic substrate
C216S077000, C438S341000, C438S481000, C438S722000, C117S952000, C257S190000
Reexamination Certificate
active
07128846
ABSTRACT:
A method including the steps of: modifying at least one part of a sapphire substrate by dry etching to thereby form any one of a dot shape, a stripe shape, a lattice shape, etc. as an island shape on the sapphire substrate; forming an AlN buffer layer on the sapphire substrate; and epitaxially growing a desired Group III nitride compound semiconductor vertically and laterally so that the AlN layer formed on a modified portion of the surface of the sapphire substrate is covered with the desirably Group III nitride compound semiconductor without any gap while the AlN layer formed on a non-modified portion of the surface of the sapphire substrate is used as a seed, wherein the AlN buffer layer is formed by means of reactive sputtering with Al as a target in an nitrogen atmosphere.
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Chiyo Toshiaki
Hayashi Toshimasa
Ito Jun
Nishijima Kazuki
Senda Masanobu
Chen Eric B.
McGinn IP Law Group PLLC
Norton Nadine
Toyoda Gosei Co,., Ltd.
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