Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Having heterojunction
Reexamination Certificate
2005-03-31
2009-06-02
Wilczewski, M. (Department: 2813)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
Having heterojunction
C438S345000, C438S347000, C438S349000, C438S353000, C257S197000, C257S572000, C257S576000, C257SE29044
Reexamination Certificate
active
07541249
ABSTRACT:
A process for producing a base connection of a bipolar transistor is provided. The process includes the steps of providing a semiconductor structure that can include a three-dimensional sacrificial structure that is selectively removable with respect to adjacent regions. A first semiconductor layer and a second layer of dielectric material is deposited. The first semiconductor layer is partially exposed by partial removal of the second layer. A first reaction layer is deposited that, together with the first semiconductor layer forms reaction products, which are selectively removable with respect to adjacent regions. Remaining material of the first reaction layer that has not reacted with the material of the first semiconductor layer is removed. A second reaction layer is deposited that, with the first semiconductor layer, forms a low-resistivity compound. Remaining material of the second reaction layer that has not reacted with the material of the first semiconductor layer is removed. An additional dielectric layer is deposited and the sacrificial structure is exposed by partial removal of the additional dielectric layer. Dielectric inner spacers are provided in an aperture formed by removal of the sacrificial structure.
REFERENCES:
patent: 5057888 (1991-10-01), Fazan et al.
patent: 5093272 (1992-03-01), Hoepfner et al.
patent: 5424227 (1995-06-01), Dietrich et al.
patent: 5587327 (1996-12-01), Koenig et al.
patent: 5731239 (1998-03-01), Wong et al.
patent: 5821149 (1998-10-01), Schuppen et al.
patent: 6020246 (2000-02-01), Koscielniak et al.
patent: 6211044 (2001-04-01), Xiang et al.
patent: 6465317 (2002-10-01), Marty
patent: 6720238 (2004-04-01), Dietrich et al.
patent: 6979884 (2005-12-01), Ahlgren et al.
patent: 6987052 (2006-01-01), Baiocchi et al.
patent: 2002/0164866 (2002-11-01), Bae et al.
patent: 2002/0197809 (2002-12-01), Asai et al.
patent: 2003/0160198 (2003-08-01), Wieczorek et al.
patent: 2004/0089918 (2004-05-01), Ohnishi et al.
patent: 2004/0099881 (2004-05-01), Franosch et al.
patent: 2005/0121748 (2005-06-01), Ahlgren et al.
patent: 2005/0199908 (2005-09-01), Geiss et al.
patent: 2005/0202669 (2005-09-01), Bromberger
patent: 2005/0221570 (2005-10-01), Bromberger
patent: 43 01 333 (1994-07-01), None
patent: 44 17 916 (1995-11-01), None
patent: 196 09 933 (1997-09-01), None
patent: 199 09 993 (1999-09-01), None
patent: 101 04 776 (2002-08-01), None
patent: 0 436 753 (1991-07-01), None
Atmel Germany GmbH
Crawford Latanya
Muncy Geissler Olds & Lowe, PLLC
Wilczewski M.
LandOfFree
Process for producing a base connection of a bipolar transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process for producing a base connection of a bipolar transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for producing a base connection of a bipolar transistor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4109521