Process for overcoming CVD aluminum selectivity loss with warm P

Coating processes – Coating by vapor – gas – or smoke – Metal coating

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4272552, 4272557, 2041921, 20419217, 438658, C23C 1606

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active

059896337

ABSTRACT:
The present invention provides a process for depositing a planarized metal film on a dielectric surface having nonuniform conductor material deposits formed thereon. The planarized metal layer is formed using a warm physical vapor deposition process at a temperature greater than about 150.degree. C., preferably greater than about 250.degree. C. The nonuniform deposits of electrically conducting material are typically formed during selective chemical vapor deposition of a metal in high aspect ratio, subhalf micron apertures. The selective CVD deposition is directly followed by warm physical vapor deposition to obtain a planarized metal film. The metallization process is preferably carried out in an integrated processing system that includes both a PVD and CVD processing chamber so that once the substrate is introduced into a vacuum environment, the metallization of the apertures to form interconnects occurs without the formation of oxides between the layers.

REFERENCES:
patent: 5100501 (1992-03-01), Blumenthal et al.
patent: 5151305 (1992-09-01), Matsumoto et al.
patent: 5169803 (1992-12-01), Miyakawa
patent: 5171412 (1992-12-01), Talieh et al.
patent: 5514425 (1996-05-01), Ito et al.

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