Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Patent
1998-06-23
1999-12-07
Chaudhuri, Olik
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
Insulated gate formation
257407, 438233, H01L 29772
Patent
active
059982896
ABSTRACT:
The process includes the deposition of a stack of Si/Si.sub.1-x Ge.sub.x /Si layers (2, 3, 4) on a gate oxide layer (1) in a single-wafer reactor and then the etching of the gate (GR) using an inorganic mask (5). Next, the gate (GR) is encapsulated in a material (7) which is non-oxidizing with respect to germanium before the isolating spacers (8) are formed.
REFERENCES:
patent: 5019882 (1991-05-01), Solomon et al.
patent: 5155571 (1992-10-01), Wang et al.
patent: 5241214 (1993-08-01), Herbots et al.
patent: 5354700 (1994-10-01), Huang et al.
patent: 5461243 (1995-10-01), Ek et al.
patent: 5461250 (1995-10-01), Burghartz et al.
patent: 5665981 (1997-09-01), Banerjee et al.
XP000198032 Ozurk, et al., "Rapid Thermal Chemical Vapor Deposition Of Germanium and Germanium/Silicon Alloys on Silicon: New Applications in the Fabrication of MOS Transistors," Materials Research Society Symposium Proceedings, vol. 224, published 1991, pp. 223-234.
XP000481715 Kistler, et al., "Symmetric CMOS In Fully-Depleted Silicon-On-Insulator Using P+ -Polycrystalline Si-Ge Gate Electrodes,"IEDM, published Dec. 5, 1993, pp. 30.2.1 through 30.2.3.
Search Report for FR 9707938 dated Mar. 12, 1998.
Chaudhuri Olik
Duy Mai Anh
France Telecom
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