Process for metallization of an insulation layer

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438633, 438636, 438637, 438648, H01L 21283, H01L 21311

Patent

active

058829997

ABSTRACT:
A process for making metal features in an insulator layer in integrated circuits is disclosed. The process involves depositing an antireflective coating layer of a material such as TiN over the insulator layer patterning both the ARC and the insulator with a series of channels or apertures vias and depositing a metal such as tungsten over the ARC and in the channels and apertures. The metal can then be planarized by CMP using the insulator as an etch top.

REFERENCES:
patent: 4657628 (1987-04-01), Holloway et al.
patent: 4770479 (1988-09-01), Tustison
patent: 4789648 (1988-12-01), Chow et al.
patent: 4826785 (1989-05-01), McClure et al.
patent: 4884123 (1989-11-01), Dixit et al.
patent: 5124780 (1992-06-01), Sandhu et al.
patent: 5152869 (1992-10-01), Ferraris et al.
patent: 5173442 (1992-12-01), Carey
patent: 5219788 (1993-06-01), Abernathey et al.
patent: 5225372 (1993-07-01), Savkar et al.
patent: 5403781 (1995-04-01), Matsumoto et al.
Kikuta et al. "Multilevel Planarized --Trench--Aluminum (PTA) Interconnection . . . " IEEE IEDM Tech. Dig, Dec. 1993, pp. 285-288.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for metallization of an insulation layer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for metallization of an insulation layer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for metallization of an insulation layer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-817348

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.