Process for making compound films

Coating processes – Direct application of electrical – magnetic – wave – or... – Plasma

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427576, 427577, 427579, 42725523, 42725528, 42725534, 42725536, 427255393, 427255394, H05H 124, C23C 1600

Patent

active

061105430

ABSTRACT:
The present invention is directed to a process for forming compound films that contain at least three elements. The films are formed on a substrate by directing a gas containing reactant species onto the substrate. The compound film is formed from an interaction between two reactant species. The third element is incorporated into the film as it formed. The third element is different from the other two elements that form the compound film and is hydrogen, deuterium, or oxygen. The presence of the third element enhances the properties of the compound film. At least a portion of the substrate remains within the purview of the plasma discharge while the compound film is formed on the substrate.

REFERENCES:
patent: 5356672 (1994-10-01), Schmitt, III et al.
patent: 5508067 (1996-04-01), Sato et al.
patent: 5525379 (1996-06-01), Takada et al.
patent: 5593741 (1997-01-01), Ikeda
Lucovsky, G., et al., "Defect Reduction in Remote Plasma Deposited Silicon Nitride By Post-Deposition Rapid Thermal Annealing," Mat. Res. Symp. Proc., vol. 525, pp. 187-192 (1988).

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