Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Patent
1997-11-12
2000-09-12
Utech, Benjamin L.
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
438745, 438754, 427 98, 427304, 430313, 430314, 20419215, H01L 21311
Patent
active
061177849
ABSTRACT:
Metal wiring is provided in an integrated circuit by sputter coating onto a semiconductor substrate a copper seed layer; depositing and patterning a photoresist; electroplating or electrolessly plating a metal within the openings of the photoresist; stripping the remaining photoresist; and etching the copper seed layer with an etchant that preferentially etches the copper seed layer at a rate higher than that for the electroplated or electrolessly plated metal.
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Abate Joseph P.
Anderson Matthew
International Business Machines - Corporation
Utech Benjamin L.
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