X-ray or gamma ray systems or devices – Specific application – Lithography
Patent
1995-08-28
1997-10-21
Wong, Don
X-ray or gamma ray systems or devices
Specific application
Lithography
25044311, 279 3, B32B 3104
Patent
active
056804288
ABSTRACT:
Disclosed are an object holding process and and an apparatus therefor in which a process strain of the object can be accurately compensated for. When the exposure operation is started, the bottom surface of the object is held by a holding unit. If the object has a strain, the process strain is calculated. Here, if the process strain is larger than a tolerance, the temperature of the object is set to an object setting temperature in a position other than an exposure position in order to contract or expand the object by a predetermined amount for a magnification correction. The bottom surface of the object is then held by the holding unit again, and the exposure of the object is performed in the exposure position.
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Amemiya Mitsuaki
Uzawa Shunichi
Canon Kabushiki Kaisha
Wong Don
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