Process for forming titanium silicide local interconnect

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437195, H01L 21768, H01L 2144

Patent

active

054439965

ABSTRACT:
A process for forming a titanium silicide local interconnect between electrodes separated by a dielectric insulator on an integrated circuit. A first layer of titanium is formed on the insulator, and a layer of silicon is formed on the titanium. The silicon layer is masked and etched to form a silicon strip connecting the electrodes, and an overlying second layer of titanium is formed over the silicon strip. The titanium and silicon are heated to form nonsilicidized titanium over a strip of titanium silicide, and the nonsilicidized titanium is removed.

REFERENCES:
patent: 4384301 (1983-05-01), Tasch, Jr. et al.
patent: 4545116 (1985-10-01), Lau
patent: 4587718 (1986-05-01), Haken et al.
patent: 4589196 (1986-05-01), Anderson
patent: 4635347 (1987-01-01), Lien et al.
patent: 4641417 (1987-02-01), McDavid
patent: 4657628 (1987-04-01), Holloway et al.
patent: 4676866 (1987-06-01), Tang et al.
patent: 4715109 (1987-12-01), Bridges
patent: 4716131 (1987-12-01), Okazawa et al.
patent: 4746219 (1988-05-01), Holloway et al.
patent: 4751198 (1988-06-01), Anderson
patent: 4777150 (1988-10-01), Denenville et al.
patent: 4784973 (1988-11-01), Steven et al.
patent: 4886764 (1989-12-01), Miller
patent: 4935380 (1990-06-01), Okumura
patent: 4994402 (1991-02-01), Chiu
patent: 5034348 (1991-07-01), Hartswick et al.
patent: 5043300 (1991-08-01), Nulman
patent: 5059554 (1991-10-01), Spinner et al.
Y. Koh et al., "Self-Aligned TiSi.sub.2 for Bipolar Applications", J. Vacuum Science and Tech. B, vol. 3, No. 6, Nov./Dec. 1985 pp. 1715-1723.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for forming titanium silicide local interconnect does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for forming titanium silicide local interconnect, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for forming titanium silicide local interconnect will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2141417

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.