Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-09-14
2010-10-26
Pham, Thanh V (Department: 2894)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S606000
Reexamination Certificate
active
07820541
ABSTRACT:
A method for forming a low defect density heterojunction between a first and a second compound, the first and second compounds each includes a group III element combined with a group V element in the periodic table, the method includes the steps of introducing in the deposition chamber the flux of the group III element for the first compound at substantially the same time while introducing in the deposition chamber a flux of the group V element for the second compound, stopping the flux of the group III element for the first compound after a first predetermined time period, stopping the flux of the group V element for the first compound after a second predetermined time period, and introducing in the deposition chamber a flux of the group III element the group V element for the second compound.
REFERENCES:
patent: 5412224 (1995-05-01), Goronkin et al.
patent: 5430310 (1995-07-01), Shibasaki et al.
patent: 5739559 (1998-04-01), Kagaya et al.
patent: 6215136 (2001-04-01), Tserng et al.
patent: 2002/0131462 (2002-09-01), Lin et al.
patent: 2003/0015767 (2003-01-01), Emrick et al.
patent: 2006/0035467 (2006-02-01), Nam et al.
patent: 2006/0215718 (2006-09-01), Yasuda et al.
patent: 2006/0246700 (2006-11-01), Johnson
Bergman Joshua I.
Brar Berinder
Ikhlassi Amal
Nagy Gabor
Sullivan Gerard J.
Pham Thanh V
Snell & Wilmer L.L.P.
Teledyne Licensing LLC
Tran Tony
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