Process for forming LDD MOS/CMOS structures

Fishing – trapping – and vermin destroying

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432 57, 432 44, H01L 21265

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active

047035510

ABSTRACT:
A process for selectively forming NMOS/PMOS/CMOS integrated circuits and for selectively incorporating any or all of lightly doped drain-source (LDD) regions, sidewall gate oxide structures, and guard band regions.

REFERENCES:
patent: 4198250 (1980-04-01), Jecmen
patent: 4356623 (1982-11-01), Hunter
patent: 4366613 (1983-01-01), Ogura et al.
patent: 4420870 (1983-12-01), Kimura
patent: 4503601 (1985-03-01), Chiao
patent: 4512073 (1985-04-01), Hsu
patent: 4519126 (1985-05-01), Hsu
patent: 4528744 (1985-07-01), Shibata
patent: 4536944 (1985-08-01), Bracco et al.
patent: 4575920 (1986-03-01), Tsunashima
patent: 4578128 (1986-03-01), Mundt et al.
patent: 4590663 (1986-05-01), Haken
patent: 4593454 (1986-06-01), Baudrant et al.
patent: 4597824 (1986-07-01), Shinada et al.
patent: 4599118 (1986-07-01), Han et al.
patent: 4616399 (1986-10-01), Ooka
patent: 4621413 (1986-11-01), Lowe et al.
Codella, "Submicron Igfet Device with Double Implanted Lightly Doped Drain/Source Structure", IBMTDB, vol. 26, No. 12, May 1984, pp. 6584-6586.
Tsang, "Fabrication of High-Performance LDDFET's with Oxide Sidewall Technology", IEEE Journal of Solid-State Circuits, vol. SC-17, No. 2, Apr. 82, pp. 220-226.

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