Process for forming high purity thin films

Fishing – trapping – and vermin destroying

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437 18, 437225, 437228, 437235, 437 38, 437 39, 118 501, 118620, H01L 2100, H01L 2102, H01L 21265, C23C 1434

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049871021

ABSTRACT:
A method is described for the formation of high purity thin films on a semiconductor substrate. In the preferred embodiment of the invention a thin film is formed on a semiconductor substrate in a plasma enhanced chemical vapor deposition system. Energized silicon ions are obtained by mass analysis and are accelerated into a hydrogen-free plasma. A reaction occurs between energized atoms within the plasma and the energized silicon ions resulting in the deposition of a thin film on the semiconductor substrate.

REFERENCES:
patent: 3916034 (1975-10-01), Tsuchimoto
patent: 4523971 (1985-06-01), Cuomo et al.
patent: 4540466 (1985-09-01), Nishizawa
patent: 4599135 (1986-07-01), Tsunekawa et al.
patent: 4624859 (1986-11-01), Akira et al.
patent: 4664747 (1987-05-01), Sekiguchi et al.
patent: 4795529 (1989-01-01), Kawasaki et al.
patent: 4800100 (1989-01-01), Herbots et al.
patent: 4870030 (1989-09-01), Markunas et al.
patent: 4916091 (1990-04-01), Freeman et al.
patent: 4947085 (1990-08-01), Nakanishi et al.
patent: 4950642 (1990-08-01), Okamoto et al.
patent: 4952273 (1990-08-01), Popov

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