Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate
Reexamination Certificate
2011-06-14
2011-06-14
Sarkar, Asok K (Department: 2891)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
C257SE21090, C438S479000, C438S492000, C438S494000, C977S762000
Reexamination Certificate
active
07960255
ABSTRACT:
A process for forming a wire portion in an integrated electronic circuit includes epitaxially growing the wire portion on a side surface of a seed layer portion (11, 12). Cross-sectional dimensions of the wire portion correspond to a thickness of the seed layer portion and to a duration of the growing step. The seed layer portion is then selectively removed while the wire portion is retained fixedly on the circuit. Afterwards, heating of the circuit can cause the wire portion becoming rounded in cross-section. The wire portion obtained may be about 10 nanometers in diameter. It may be used for forming a channel of a MOS transistor devoid of short channel effect.
REFERENCES:
patent: 6326311 (2001-12-01), Ueda et al.
patent: 6858478 (2005-02-01), Chau et al.
patent: 7078299 (2006-07-01), Maszara et al.
patent: 2006/0197163 (2006-09-01), Kato
patent: 2007/0026617 (2007-02-01), Adkisson et al.
patent: 10 2005 038 943 (2006-03-01), None
International Search Report, PCT/EP2008/062622, Dec. 23, 2008, 3 pages.
Coronel Philippe
Dumont Benjamin
Möller Markus
Pouydebasque Arnaud
Gardere Wynne & Sewell LLP
NXP B.V.
Sarkar Asok K
STMicroelectronics (Crolles 2) SAS
Szuwalski Andre M.
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