Process for forming a high density semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257303, H01L 27108

Patent

active

059090448

ABSTRACT:
A method for forming an integrated circuit device, and the product thereby produced, are disclosed. The disclosed method includes the steps of obtaining a substrate with a patterned gate conductor and cap insulator, forming a dielectric masking layer having at least one opening, and, using the opening in the dielectric masking layer as a mask, forming a trench capacitor which is self-aligned to the cap insulator edge. The method is particularly useful for producing a DRAM device having a dense array region with self-aligned deep trench storage capacitors connected by buried straps.

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Nesbit, L., et al. "A 0.6 micron squared Trench DRAM Cell . . . ", IEDM 1993, pp. 627-630.

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