Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-05-24
2005-05-24
Brock, II, Paul E (Department: 2815)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S605000, C438S610000, C438S652000, C438S658000, C438S666000
Reexamination Certificate
active
06897137
ABSTRACT:
A process for fabricating ohmic contacts in a field-effect transistor includes the steps of: thinning a semiconductor layer forming recessed portions in the semiconductor layer; depositing ohmic contact over the recessed portions; and heating the deposited ohmic contacts. The field-effect transistor comprises a layered semiconductor structure which includes a first group III nitride compound semiconductor layer doped with a charge carrier, and a second group III nitride compound semiconductor layer positioned below the first layer, to generate an electron gas in the structure. After the heating step the ohmic contacts communicate with the electron gas. As a result, an excellent ohmic contact to the channel of the transistor is obtained.
REFERENCES:
patent: 5696389 (1997-12-01), Ishikawa et al.
patent: 5760418 (1998-06-01), Lee et al.
patent: 5766695 (1998-06-01), Nguyen et al.
patent: 6100548 (2000-08-01), Nguyen et al.
patent: 6391696 (2002-05-01), Onda
patent: 6492669 (2002-12-01), Nakayama et al.
patent: 20010013604 (2001-08-01), Hase
patent: 20040021152 (2004-02-01), Nguyen et al.
patent: 20040029330 (2004-02-01), Nguyen et al.
patent: 0 899 782 (1999-03-01), None
patent: 2002016087 (2002-01-01), None
patent: 0113436 (2001-02-01), None
patent: 0157929 (2001-08-01), None
Hashimoto Paul
Nguyen Chanh N.
Nguyen Nguyen Xuan
Brock II Paul E
HRL Laboratories LLC
Ladas & Parry LLP
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