Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step
Patent
1988-04-13
1990-03-27
Lacey, David L.
Adhesive bonding and miscellaneous chemical manufacture
Delaminating processes adapted for specified product
Delaminating in preparation for post processing recycling step
156654, 156659, 1566591, 156662, H07L 21306
Patent
active
049117831
ABSTRACT:
In a process for etching complicatedly structured recesses in a silicon substrate, in which acid mixtures containing HF and HNO.sub.3 are used, the problems occurring with a photoresist mask are avoided, on the one hand, by using an SiO.sub.2 mask layer and on the other hand, by fabricating the mask layer beforehand with a thickness profile corresponding to the depth profile to be etched, thereby completely separating the masking and etching steps from each other.
REFERENCES:
patent: 3772102 (1973-11-01), Tiemann et al.
patent: 3878008 (1975-04-01), Gleason et al.
patent: 3980580 (1976-09-01), Takamiya et al.
patent: 4225229 (1981-03-01), Morcom
patent: 4261791 (1981-04-01), Shwartzman
patent: 4405405 (1983-09-01), Fujii et al.
patent: 4405709 (1983-09-01), Katano et al.
patent: 4417947 (1983-11-01), Pan
patent: 4425183 (1984-01-01), Maheras et al.
patent: 4484979 (1984-11-01), Stocker
patent: 4497684 (1985-02-01), Sebesta
patent: 4502915 (1985-03-01), Carter et al.
patent: 4505026 (1985-03-01), Bohr et al.
patent: 4579812 (1986-04-01), Bower
patent: 4613404 (1986-09-01), Takei
patent: 4624740 (1986-11-01), Abrams et al.
patent: 4678538 (1987-07-01), Haond et al.
patent: 4708765 (1987-11-01), Newman et al.
patent: 4773964 (1988-09-01), Haond et al.
patent: 4787997 (1988-11-01), Saito et al.
patent: 4799991 (1989-01-01), Dockrey
Schwartz, Robbins Chemical Etching of Silicon, J. Electrochem. Soc: J of Solid St. Tech., 12/76, pp. 1903-1909.
BBC Brown Boveri AG
Johnson Lou Ann
Lacey David L.
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