Process for epitaxial deposition of silicon

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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Details

156612, 156613, 156650, 156654, 156657, 156662, 4272552, 437 85, H01L 21306, H01L 21205, C03B 2300, B44C 122

Patent

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048744646

ABSTRACT:
The present invention relates to a high throughput single crystal epitaxial deposition process which achieves increased uniformity, both wafer to wafer and across the wafer surface. There is provided an epitaxial deposition process characterized by low-level cooling periods which minimize temperature changes between deposition cycles and inter-cycle cleaning so that each new wafer is presented with a substantially equivalent deposition environment.

REFERENCES:
patent: 3473978 (1969-10-01), Jackson et al.
patent: 4138306 (1979-02-01), Niwa

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