Process for enhancing solubility and reaction rates in...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Fluid growth from liquid combined with preceding diverse...

Reexamination Certificate

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C438S597000, C438S678000, C438S680000, C438S685000, C438S686000, C438S688000, C257SE21295

Reexamination Certificate

active

08043944

ABSTRACT:
Processes for enhancing solubility and the reaction rates in supercritical fluids are provided. In preferred embodiments, such processes provide for the uniform and precise deposition of metal-containing films on semiconductor substrates as well as the uniform and precise removal of materials from such substrates. In one embodiment, the process includes, providing a supercritical fluid containing at least one reactant, the supercritical fluid being maintained at above its critical point, exposing at least a portion of the surface of the semiconductor substrate to the supercritical fluid, applying acoustic energy, and reacting the at least one reactant to cause a change in at least a portion of the surface of the semiconductor substrate.

REFERENCES:
patent: 3602635 (1971-08-01), Romanklw
patent: 5789027 (1998-08-01), Watkins et al.
patent: 6143657 (2000-11-01), Liu et al.
patent: 6224713 (2001-05-01), Hembree et al.
patent: 6261953 (2001-07-01), Uozumi
patent: 6426116 (2002-07-01), Sunol
patent: 6432724 (2002-08-01), Ahn et al.
patent: 6537916 (2003-03-01), Mullee et al.
patent: 6653236 (2003-11-01), Wai et al.
patent: 6689700 (2004-02-01), Watkins et al.
patent: 6715498 (2004-04-01), Humayun et al.
patent: 7267727 (2007-09-01), McDermott et al.
patent: 2002/0022362 (2002-02-01), Ahn et al.
patent: 2003/0012931 (2003-01-01), Kuroda et al.
patent: 2003/0157248 (2003-08-01), Watkins et al.
patent: 2003/0161954 (2003-08-01), Blackburn et al.
patent: 2004/0266219 (2004-12-01), Sarigiannis et al.
patent: 2005/0136292 (2005-06-01), Mariani et al.
patent: 2005/0191861 (2005-09-01), Verhaverbeke
patent: 2006/0065627 (2006-03-01), Clarke et al.
patent: 01/32951 (2001-05-01), None
Brian S. Hoyle, et al., Ultrasound In The Process Industries, Engineering Science and Education Journal, Jun. 1994, pp. 119-122.
C. Horst, et al., Activated Solid-Fluid Reactions In Ultrasound Reactors, Chemical Engineering Science 54 (1999), pp. 2849-2858, Institut fur Chemische Verfahrenstechnik, Technische Universitiat Clausthal, LeibnizstraBe 17, D-38678 Clausthal-Zellerfeld, Germany.
Leigh Hagenson Thompson, et al., The Rate Enhancing Effect of Ultrasound by Inducing Supersaturation in A Solid-Liquid System, Chemical Engineering Science 55 (2000), pp. 3085-3090.
Porous Silicates Inspired By Nature: Fabrication and Processing, Materials Today, vol. 7, Issue 3, p. 18, Mar. 2004.
Brown, et al., Carbon Dioxide-Dilated Block Copolymer Templates for Nanostructured Materials, Materials Research Society Symposium Proceedings, vol. 584, pp. 169-174, Dec. 1999.
Watkins, et al., Supercritical Fluid Technology for Semiconductor Device Fabrication Deposition of Metals and Mesoporous Silicates from Carbon Dioxide, Presentation Abstract University of Arizona.
Wilson, Materials Made Under Pressure, Chemical & Engineering News: Science/Technology, vol. 78, No. 51, pp. 1-7, Dec. 18, 2000.

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