Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Patent
1995-08-28
1997-08-26
Graybill, David E.
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
438119, 324757, 156325, H01L 21288, H01L 2158, H01L 2160
Patent
active
056610424
ABSTRACT:
A process for using removable Z-axis anisotropically conductive adhesive material (21) which includes water, a matrix resin (23), and conductive spheres (22). The material (21) is suitable for providing temporary contact between electronic devices. In one embodiment, the material (21) is used to temporarily bond a semiconductor wafer (11) to a probe substrate (12) for wafer-level burn-in.
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Fang Treliant
Hwang Lih-Tyng
Williams William M.
Graybill David E.
Jackson Kevin B.
Motorola Inc.
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