Process and device for the deposition of an at least...

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step

Reexamination Certificate

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C118S716000, C257SE21001

Reexamination Certificate

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10473222

ABSTRACT:
In a process and device for depositing an at least partially crystalline silicon layer a plasma is generated and a substrate (24) is exposed under the influence of the plasma to a silicon-containing source fluid for deposition of silicon therefrom. A pressure drop is applied between a location (12) where the source fluid is supplied and the substrate (24). In addition to the source fluid an auxiliary fluid is also injected which is able to etch non-crystalline silicon atoms. The substrate (24) is exposed to both the source fluid and the auxiliary fluid.

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patent: WO 00/74932 (2000-12-01), None
Wilbers A T M et al: “Amorphous Hydrogenated Silicon Films Produced by an Expanding Argon-Silane Plasma Investigated with Spectroscopic IR Ellipsometry” Thin Solid Films, Elsevier-Sequoia S.A. Lausanne, CH, vol. 204, No. 1, Sep. 20, 1991, pp. 59-75, XP000275034.
Severens R J et al: “An Expanding Thermal Plasma for Deposition of A-SI:H” Amorphous Silicon Technology 1995. San Francisco, Apr. 18-21, 1995, MRS Symposium Proceedings, Pittsburgh, MRS, US, vol. 377, Apr. 18, 1995, pp. 33-38, XP000656314.
Patent Abstracts of Japan, vol. 010, No. 049, Feb. 26, 1986 & JP 60 194065 A, Oct. 2, 1985, abstract.
Patent Abstracts of Japan, vol. 010, No. 125, May 10, 1986 & JP 60 257130 A, Dec. 18, 1985, abstract.

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