Process and apparatus for measuring pretilt angle of liquid crys

Details Process and apparatus for measuring pretilt angle of liquid crys Process and apparatus for measuring pretilt angle of liquid crys

1993-09-03

1995-02-28

Rosenberger, Richard A.

Optics: measuring and testing

By polarized light examination

Of surface reflection

356364, G01N 2121

Patent

active

053942450

ABSTRACT:
The present invention relates to a method and apparatus for measuring a pretilt angle. The pretilt angle is measured as follows: an alignment layer and a liquid-crystal layer each of which has a refractive index smaller than that of a substrate are laminated on the substrate, a polarized light is emitted into the substrate and made to be reflected on an interface between the substrate and the alignment layer to measure a reflectance, and a ratio of logarithm of reflectances of lights crossing each other is calculated to give a pretilt angle. The apparatus for measuring a pretilt angle comprises a system keeping at least a substrate, a photo system composed of a light source which emits a linear polarized light into the substrate, a detecting system for measuring reflectance of light reflected inside the substrate, and a data-processing system which calculates a pretilt angle from a ratio of logarithm of reflectances of polarized lights crossing each other.

REFERENCES:
patent: 5172187 (1992-12-01), Brosig
patent: 5245403 (1993-09-01), Kato et al.
Scheffer et al., "Accurate Determination of Liquid-Crystal Tilt Bias Angles", Journal of Applied Physics, vol. 48, No. 5, pp. 1783-1792 (May 1977).

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