4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Veronique H. M. P. Prejean-Lefevre

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Procedure for measuring the dimensions of the optical focus of a

X-ray or gamma ray systems or devices – Accessory – Testing or calibration
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Process and apparatus for automatically characterizing, optimizi

Image analysis – Applications – Manufacturing or product inspection
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Process and apparatus for the acquisition and processing of scre

Image analysis – Histogram processing – For setting a threshold
Patent

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Profile ID: LFUS-PAI-P-1356961

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