Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent
1977-04-07
1980-03-04
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
G01J 330
Patent
active
041914759
ABSTRACT:
Apparatus for analyzing a sample by emission spectrography comprising a laser, optical means for focusing light emitted by the laser onto the surface of the sample, the power of the laser being sufficient to volatilize and excite the substances constituting the sample and a spectrograph which analyzes the light emitted by the surface of the sample, wherein the angle of impact .alpha. of the light emitted by the latter and focused on the surface of the sample is greater than 10.degree. and the optical axis of the spectrograph passes through the impact point of the laser beam on the sample and is perpendicular to the surface of said sample.
An application is to the analysis of glass samples used for the vitrification of nuclear fission products.
REFERENCES:
patent: 3188180 (1965-06-01), Holler
patent: 3832558 (1974-08-01), Fern et al.
patent: 3841757 (1974-10-01), Overhoff et al.
"Spectrochemical Analysis of Molten Metal Using a Pulsed Laser Source," Runge et al., Spectrochimica Acta, Sep. 1966, vol. 22, pp. 1678-1680.
Commissariat a l''Energie Atomique
Gordon Pearne
McGraw Vincent P.
LandOfFree
Process and apparatus for analyzing a sample by emission spectro does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process and apparatus for analyzing a sample by emission spectro, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process and apparatus for analyzing a sample by emission spectro will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2037721