Procedure for etching of materials at the surface with...

Etching a substrate: processes – Gas phase etching of substrate – Irradiating – ion implanting – alloying – diffusing – or...

Reexamination Certificate

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C216S063000, C216S066000

Reexamination Certificate

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07452477

ABSTRACT:
The invention relates to a procedure for etching of materials at the surface by focussed electron beam induced chemical reaction at the surface, with the following steps: a) in a vacuum atmosphere the material which is to be etched is irradiated with at least one beam of molecules and at least one first beam of electrons, whereby the irradiated material and the molecules of the beam of molecules are excited in a way that a chemical reaction takes place and forms a reaction product, which is not gaseous
ot volatile—reaction step. The invention is characterized in that b) the reaction product is evaporated from said surface by an second beam of electrons, which heats the material locally to a temperature above the vaporisation temperature of the reaction product —removal step—.

REFERENCES:
patent: 3968476 (1976-07-01), McMahon
patent: 4650778 (1987-03-01), Klabunde et al.
patent: 5055696 (1991-10-01), Haraichi et al.
patent: 5113072 (1992-05-01), Yamaguchi et al.
patent: 5151135 (1992-09-01), Magee et al.
patent: 5229320 (1993-07-01), Ugajin
patent: 5665277 (1997-09-01), Johnson et al.
patent: 5665658 (1997-09-01), Passlack
patent: 5683547 (1997-11-01), Azuma et al.
patent: 6038015 (2000-03-01), Kawata
patent: 6067062 (2000-05-01), Takasu et al.
patent: 6077621 (2000-06-01), Allen et al.
patent: 6261938 (2001-07-01), Beauvais et al.
patent: 6387530 (2002-05-01), Liu et al.
patent: 6673127 (2004-01-01), Allen et al.
patent: 6677586 (2004-01-01), Nasser-Ghodsi et al.
patent: 6751516 (2004-06-01), Richardson
patent: 6787783 (2004-09-01), Marchman et al.
patent: 6843927 (2005-01-01), Naser-Ghodsi
patent: 6943350 (2005-09-01), Nasser-Ghodsi et al.
patent: 2001/0052577 (2001-12-01), Aki et al.
patent: 2003/0000921 (2003-01-01), Liang et al.
patent: 2003/0066749 (2003-04-01), Golovchenko et al.
patent: 2004/0033425 (2004-02-01), Koops
patent: 2006/0192141 (2006-08-01), Koops
patent: 100 42 098 (2002-03-01), None
patent: WO 02 19375 (2002-03-01), None
ISR/EP 02023217, Apr. 29, 2003, NaWoTec GmbH.
Koops , High-Resolution Electron-Beam Induced Deposition, Journal of Vacuum Science: Part B, 1988, pp. 477-481, V 6, No. 1, American Institute of Physics, New York, US.
Haight et al., MARS: Femtosecond laser mask advanced repair system in manufacturing,J. Vac. Sci. Technol. B17(6), Nov./Dec. 1999, 3137-3143, 17(6),American Vacuum Society.
Ehrlich et al., A Review of Laser-Microchemical Processing, J. Vac. Sci. Technol. B, Oct.Dec. 1983, 969-984, vol. 1, No. 4, American Vacuum Society.

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