Probing apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

11330599

ABSTRACT:
A probing apparatus includes a mechanism apparatus. The mechanism apparatus includes a base body, a vibration absorber, a shifting mechanism, and a stage connected via the base body to a ground terminal. A probe, positioned over the stage, is connected to a measurement terminal of a measuring apparatus via a signal cable. The signal cable has a connecting terminal connected to the measurement terminal of the measuring apparatus. A shielding cover, positioned over a measured device on a glass substrate held on the stage, has an area not smaller than an area of the measured device and not greater than four times the area of the measured device. The shielding cover is grounded.

REFERENCES:
patent: 5321453 (1994-06-01), Mori et al.
patent: 5459594 (1995-10-01), Nakanishi et al.
patent: 5479106 (1995-12-01), Takahashi et al.
patent: 5703487 (1997-12-01), Mishra
patent: 5835997 (1998-11-01), Yassine
patent: 6137300 (2000-10-01), Hayashida
patent: 6194907 (2001-02-01), Kanao et al.
patent: 6492827 (2002-12-01), Mazur et al.
patent: 6522158 (2003-02-01), Fung et al.
patent: 6783371 (2004-08-01), Self et al.
patent: 6791350 (2004-09-01), Taguchi
patent: 6828817 (2004-12-01), Fujita
patent: 6861856 (2005-03-01), Dunklee et al.
patent: 6906543 (2005-06-01), Lou et al.
patent: 2004/0222807 (2004-11-01), Dunklee
patent: 2005/0110508 (2005-05-01), Kishida
patent: 2005/0156610 (2005-07-01), Navratil et al.
patent: 11065475 (1999-03-01), None
patent: 2005156253 (2005-06-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Probing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probing apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3873147

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.