4. Radiant energy
  5. Irradiation of objects or material
  6. Irradiation of semiconductor devices

Tokyo Cathode Laboratory Co., Ltd.

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Charge detector for semiconductor substrates

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Patent

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Multi-layered probe for a probecard

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Probing apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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