Probe repair methods

Metal working – Method of mechanical manufacture – Repairing

Reexamination Certificate

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Details

C029S402010, C029S402030, C029S402060, C029S402080, C029S846000, C029S847000, C324S754090

Reexamination Certificate

active

07437813

ABSTRACT:
A method and apparatus for repairing a probe on a probe card is provided. A plurality of beams is formed on a beam panel. The plurality of beams includes a replacement beam. After identifying a damaged beam on the probe card, the damaged beam is removed from the probe card. The beam panel is aligned with the probe card. After the beam panel is aligned, the aligned beam panel is temporarily affixed to the probe card. After the beam panel is temporarily affixed to the probe card, the replacement beam is affixed at a location previously occupied by the damaged beam. After the replacement beam is affixed at the location, the beam panel is removed from the probe card.

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European Patent Office, “Notification of Transmittal of The International Search Report and The Written Opinion of The International Searching Authority, or The Seclaration”, International Application No. PCT/US2007/003475, dated Sep. 5, 2007, 12 pages.
Claims, International application No. PCT/US2007/003475, 2 pages.

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