Probe for scanning tunneling microscope and manufacturing method

Details Probe for scanning tunneling microscope and manufacturing method Probe for scanning tunneling microscope and manufacturing method

1993-05-25

1994-10-18

Dzierzynski, Paul M.

Radiant energy

Inspection of solids or liquids by charged particles

250307, H01J 3726

Patent

active

053571096

ABSTRACT:
A probe for a scanning tunneling microscope and manufacturing method therefor in which tetrapod-shaped whiskers of zinc oxide are placed on a conductive material which is adhered on a tip part of a fine wire of platinized iridium in a manner that three legs of the tetrapod contact the conductive material; the conductive material is heated for melting only the conductive material; and cooling the melted conductive material for being hardened, thereby the stem part of the whisker is inserted into the conductive material.

REFERENCES:
patent: 4943720 (1990-07-01), Jones
Holl Musselman, Inga and Phillip E. Russell, "Platinum/iridium tips with Controlled Geometry for Scanning Tunneling Microscopy," Journal of Vacuum Science and Technology, vol. 8, No. 4, Jul. 1990, pp. 3558-3562.
Kaneko, Reizo and Shigemitu Oguchi, "Ion-Implanted Diamond Tip for a Scanning Tunneling Microscope," Japanese Journal of Applied Physics, vol. 29, No. 9, Sep. 1990, pp. 1854-1855.

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