Probe drive mechanism and electronic device which uses the same

Radiant energy – Inspection of solids or liquids by charged particles

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250307, H01J 3700

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active

053348354

ABSTRACT:
A probe drive mechanism includes a cantilever portion in which a piezoelectric layer is disposed between electrode layers, and a circuit portion which is positioned adjacent to the cantilever portion and drives the cantilever. The cantilever portion and the circuit portion are formed on the same substrate. A protection layer covers the circuit portion and part of the substrate, and the cantilever portion is formed on the protection layer adjacent to the circuit portion.

REFERENCES:
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patent: 4638206 (1987-01-01), Tsunooka et al.
patent: 4906840 (1990-03-01), Zdeblick et al.
G. Binning, et al., "Surface Studies by Scanning Tunneling Microscopy", Physical Review Letters, The American Physical Society, vol. 49, No. 1, pp. 57-60 (Jul. 5, 1982).
Shinya Akamine, et al., "Microfabricated Scanning Tunneling Microscope", IEEE Electron Device Letters, vol. 10, No. 11, pp. 490-492 (Nov. 10, 1989).
Transducers '89, The 5th International Conference on Solid-State Sensors and Actuators & Eurosensors III, Abstracts, Conference Organizers in Medicine, Science and Technology, Lecture No. D3.6, p. 271 (Jun. 25-30, 1989).

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