Probe card including a sub-plate with a main supporter and a...

Details Probe card including a sub-plate with a main supporter and a... Probe card including a sub-plate with a main supporter and a...

2011-08-02

2011-08-02

Velez, Roberto (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755070

Reexamination Certificate

active

07990168

ABSTRACT:
A probe card to connect a semiconductor device to test equipment includes a Printed Circuit Board (PCB) in which an electrical wiring pattern is formed, a first connector fixed on an upper surface of the PCB to connect the test equipment to the PCB, probe needles connected to electrode pads of the semiconductor device, and a Flexible PCB (FPCB) to connect the PCB to the probe needles. Accordingly, a signal transmission characteristic can be enhanced, test expenses can be reduced, and ground noise can be reduced.

REFERENCES:
patent: 5604446 (1997-02-01), Sano
patent: 6411353 (2002-06-01), Yarita et al.
patent: 6750669 (2004-06-01), Holcombe
patent: 7245134 (2007-07-01), Granicher et al.
patent: 7420380 (2008-09-01), Kasukabe et al.
patent: 7-94561 (1995-04-01), None
patent: 11-344509 (1999-12-01), None
patent: 2000-314748 (2000-11-01), None
patent: WO 2005003793 (2005-01-01), None

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