Probe card assembly

Details Probe card assembly Probe card assembly

1995-04-24

1996-06-25

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324758, G01R 3102

Patent

active

055303714

ABSTRACT:
A carousel for a probe card assembly which includes opposed planar rings supported and spaced apart by flexible supports. The flexible supports, while supporting the planar rings, also allow the planar rings to rotate with respect to each other. Also included are a plurality of connecting means which pass through perforations in the planar rings so as to thereby make interconnection between a probe card and an interface card in a semiconductor test system.

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Morton et al; "High Performance AC Chip Contaccctor;" IBM Technical Disclosure Bulletin; vol. 18, No. 3; Aug. 1975.

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