Probe card array check plate with transition zones

Details Probe card array check plate with transition zones Probe card array check plate with transition zones

1996-06-05

1998-11-03

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3102

Patent

active

058314431

ABSTRACT:
A probe card array check plate is provided with transition zones to prevent a semi-conductor probe from impacting an epoxy joint in the check plate during an over travel test. The transition zone is in the form of beveled edges or tapers between first and second testing surfaces. In alternate embodiments, two or more different types of testing surfaces are juxta positioned, or an optical measurement window is made sufficiently large to prevent an over traveling probe tip from entering an epoxied area.

REFERENCES:
patent: 4918374 (1990-04-01), Stewart et al.
patent: 5065092 (1991-11-01), Sigler
patent: 5198756 (1993-03-01), Jenkins et al.
patent: 5508629 (1996-04-01), Stewart et al.
patent: 5561377 (1996-10-01), Strid et al.
patent: 5657394 (1997-08-01), Schwartz et al.
patent: 5659255 (1997-08-01), Strid et al.

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