Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-03-01
2011-03-01
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S758010
Reexamination Certificate
active
07898272
ABSTRACT:
A probe card includes a flat wiring board having a wiring pattern corresponding to a circuit structure for generating a signal for a test, an interposer that is stacked on the wiring board and relays wirings of the wiring board, a space transformer that is stacked on the interposer and fastened thereto by an adhesive, transforms a space between the wirings relayed by the interposer, and leads the wirings out to a surface opposite a surface facing the interposer, and a probe head that is stacked on the space transformer and houses and holds a plurality of probes.
REFERENCES:
patent: 4567432 (1986-01-01), Buol et al.
patent: 5974662 (1999-11-01), Eldridge et al.
patent: 6043666 (2000-03-01), Kazama et al.
patent: 6334247 (2002-01-01), Beaman et al.
patent: 6509751 (2003-01-01), Mathieu et al.
patent: 6686754 (2004-02-01), Miller
patent: 7071715 (2006-07-01), Shinde et al.
patent: 7081766 (2006-07-01), Satou et al.
patent: 7368927 (2008-05-01), Smith et al.
patent: 7772858 (2010-08-01), Sasaki et al.
patent: 2004/0179343 (2004-09-01), Karavakis et al.
patent: 63-293934 (1988-11-01), None
patent: 09-199552 (1997-07-01), None
patent: 10-019926 (1998-01-01), None
patent: 3386077 (1998-06-01), None
patent: 2000-091391 (2000-03-01), None
patent: 2005-164600 (2005-06-01), None
patent: 200508618 (2005-03-01), None
patent: 200537113 (2005-11-01), None
International Search Report mailed Aug. 21, 2007, issued on PCT/JP2007/061317.
Notice of Allowance for Taiwanese Patent Application No. 096120475 mailed Oct. 4, 2010.
Akao Takashi
Inuma Tsuyoshi
Nagaya Mitsuhiro
Nakayama Hiroshi
Sasaki Shunsuke
Benitez Joshua
Edwards Angell Palmer & & Dodge LLP
Nguyen Ha Tran T
NHK Spring Co. Ltd.
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