Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-11-21
2006-11-21
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S761010, C324S762010
Reexamination Certificate
active
07138812
ABSTRACT:
Provided is a probe card including: a printed circuit board comprising a ground electrode; at least one dielectric disposed below the ground electrode; and a plurality of needles, each of which comprises: a first end portion contacting a wafer pad of a semiconductor device, a second end portion electrically connected to the printed circuit board, and the remaining portion excepting the first and second end portions surrounded by the at least one dielectric. A metal plate is disposed below the at least one dielectric; and a connecting pin electrically connects the metal plate to the ground electrode and fixes the at least one dielectric and the metal plate to the printed circuit board.
REFERENCES:
patent: 4523144 (1985-06-01), Okubo et al.
patent: 4719417 (1988-01-01), Evans
patent: 5382898 (1995-01-01), Subramanian
patent: 5521518 (1996-05-01), Higgins
patent: 6046599 (2000-04-01), Long et al.
patent: 6472890 (2002-10-01), Khoury et al.
patent: 6515358 (2003-02-01), Dass et al.
patent: 6535003 (2003-03-01), Aldaz et al.
patent: 02-050452 (1990-02-01), None
patent: 05-041416 (1993-02-01), None
patent: 05-113451 (1993-05-01), None
patent: 11-248748 (1999-09-01), None
patent: 2001-153885 (2001-06-01), None
patent: 10-1996-0005096 (1996-04-01), None
Kim Young-bu
Park Il-Chan
Yoo Du-sik
Isla-Rodas Richard
Karlsen Ernest
Mills & Onello LLP
Samsung Electronics Co,. Ltd.
LandOfFree
Probe card does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Probe card, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe card will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3646127