Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-11-05
2010-06-15
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090, C439S862000, C439S066000
Reexamination Certificate
active
07737714
ABSTRACT:
A probe array is assembled on a probe card platform. Each of the probes in the probe array has a probe base that includes a gripping handle. The probe bases have two or more different shapes. The probe bases of different shapes are interleaved such that any two adjacent probes on the platform have probe bases of different shapes. The arrangement of the probes increases effective spacing between the probes to facilitate the maneuvering of a handling tool.
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Blakely , Sokoloff, Taylor & Zafman LLP
Nguyen Ha Tran T
Vazquez Arleen M
WinMEMS Technologies Holdings Co., Ltd.
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