Measuring and testing – Sampler – sample handling – etc.
Reexamination Certificate
2008-07-29
2008-07-29
Raevis, Robert R (Department: 2856)
Measuring and testing
Sampler, sample handling, etc.
Reexamination Certificate
active
07404339
ABSTRACT:
A probe mechanism and a sample pick up mechanism of the invention are provided at an observing apparatus or an analyzing apparatus and characterized in including a tip member comprising a needle-like member brought into contact with a sample, including a driving electrostatic actuator and means for monitoring a change in an electrostatic capacitance between electrodes of the electrostatic actuator, and capable of sensing that the probe is brought into contact with a sample by the monitor.
REFERENCES:
patent: 2001/0008476 (2001-07-01), Imamura
patent: 2005/0072231 (2005-04-01), Chojnacki et al.
patent: 2006/0014196 (2006-01-01), Konno et al.
patent: 2006/0220659 (2006-10-01), Konno et al.
patent: 2007/0187623 (2007-08-01), Skidmore et al.
patent: 2000-2630 (2000-01-01), None
patent: 2001-83055 (2001-03-01), None
patent: 2002-33366 (2002-01-01), None
patent: 2002-333387 (2002-11-01), None
U.S. Appl. No. 60/505,026.
Hayashi Hiroki
Iwasaki Kouji
Konno Takashi
Munekane Masanao
Aoi Electronics Co., Ltd.
Brinks Hofer Gilson & Lione
Raevis Robert R
SII Nano Technology Inc.
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