Probability of fault function determination using critical...

Details Probability of fault function determination using critical... Probability of fault function determination using critical...

2007-11-27

2007-11-27

Whitmore, Stacy (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

Reexamination Certificate

active

10906548

ABSTRACT:
Methods, systems and program products for determining a probability of fault (POF) function using critical defect size maps. Methods for an exact or a sample POF function are provided. Critical area determinations can also be supplied based on the exact or sample POF functions. The invention provides a less computationally complex and storage-intensive methodology.

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