Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-02-20
2007-02-20
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
10908101
ABSTRACT:
A system and method of performing microelectronic chip timing analysis, wherein the method comprises identifying failing timing paths in a chip; prioritizing the failing timing paths in the chip according to a size of random noise events occurring in each timing path; attributing a slack credit statistic for all but highest order random noise events occurring in each timing path; and calculating a worst case timing path scenario based on the prioritized failing timing paths and the slack credit statistic. Preferably, the random noise events comprise non-clock events. Moreover, the random noise events may comprise victim/aggressor net groups belonging to different regularity groups. Preferably, the size of random noise events comprises coupled noise delta delays due to the random noise events occurring in the chip.
REFERENCES:
patent: 5535133 (1996-07-01), Petschauer et al.
patent: 5555506 (1996-09-01), Petschauer et al.
patent: 5596506 (1997-01-01), Petschauer et al.
patent: 6029117 (2000-02-01), Devgan
patent: 6117182 (2000-09-01), Alpert et al.
patent: 6253359 (2001-06-01), Cano et al.
patent: 6363516 (2002-03-01), Cano et al.
patent: 6378109 (2002-04-01), Young et al.
patent: 6405348 (2002-06-01), Fallah-Tehrani et al.
patent: 6480998 (2002-11-01), Mukherjee et al.
patent: 6493853 (2002-12-01), Savithri et al.
patent: 6499131 (2002-12-01), Savithri et al.
patent: 6510540 (2003-01-01), Krauter et al.
patent: 6523149 (2003-02-01), Mehrotra et al.
patent: 6594805 (2003-07-01), Tetelbaum et al.
patent: 6601222 (2003-07-01), Mehrotra et al.
patent: 6615395 (2003-09-01), Hathaway et al.
patent: 6651229 (2003-11-01), Allen et al.
patent: 6718530 (2004-04-01), Kim et al.
patent: 6721929 (2004-04-01), Li et al.
patent: 6732339 (2004-05-01), Savithri et al.
patent: 6766264 (2004-07-01), Jung et al.
patent: 6799153 (2004-09-01), Sirichotiyakul et al.
patent: 6836873 (2004-12-01), Tseng et al.
patent: 6898204 (2005-05-01), Trachewsky et al.
patent: 2002/0021135 (2002-02-01), Li et al.
patent: 2002/0188577 (2002-12-01), Vidhani et al.
patent: 2003/0070150 (2003-04-01), Allen et al.
patent: 2003/0079191 (2003-04-01), Savithri et al.
patent: 2003/0115563 (2003-06-01), Chen
patent: 2003/0159121 (2003-08-01), Tseng
patent: 2003/0227032 (2003-12-01), Nawa et al.
patent: 2003/0237066 (2003-12-01), Ito
patent: 2004/0019864 (2004-01-01), Kim et al.
patent: 2004/0024554 (2004-02-01), Jung et al.
patent: 2004/0060022 (2004-03-01), Allen et al.
patent: 2004/0078176 (2004-04-01), Bowen et al.
patent: 2004/0098684 (2004-05-01), Amekawa
patent: 2004/0103386 (2004-05-01), Becer et al.
patent: 2004/0205678 (2004-10-01), Tuncer et al.
patent: 2004/0205680 (2004-10-01), Gyure et al.
patent: 2004/0205682 (2004-10-01), Gyure et al.
patent: 2005/0022145 (2005-01-01), Tetelbaum et al.
patent: 2005/0060675 (2005-03-01), Tetelbaum
Foreman Eric A.
Habitz Peter A.
Schaeffer Gregory M.
Do Thuan
Gibb I.P. Law Firm LLC
International Business Machines - Corporation
Kotulak, Esq. Richard M.
LandOfFree
Prioritizing of nets for coupled noise analysis does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Prioritizing of nets for coupled noise analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Prioritizing of nets for coupled noise analysis will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3812292