Pressure sensor method of fabrication

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Physical stress responsive

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

216 2, 216 33, 216 41, 216 56, 438455, 438978, 438704, H01L 2100

Patent

active

056328540

ABSTRACT:
A pressure sensor (11) and its method of fabrication include etching a V-groove (19) in a first surface (16) of a first substrate (12), bonding a second substrate (24) to the first substrate (12), thinning the second substrate (24) to form a diaphragm (32) overlying the V-groove (19), and etching a port (38) from the second surface (18) of the first substrate (12) to the V-groove (19). Tetra-methyl-ammonium-hydroxide is preferably used to anisotropically etch the V-groove (19), and an anisotropic plasma reactive ion etch is preferably used to etch the port (38).

REFERENCES:
patent: 4975390 (1990-12-01), Fujii et al.
patent: 5095349 (1992-03-01), Fujii et al.
patent: 5295395 (1994-03-01), Hocker et al.
patent: 5316618 (1994-05-01), van Lintel
patent: 5318652 (1994-06-01), Hocker et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Pressure sensor method of fabrication does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Pressure sensor method of fabrication, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pressure sensor method of fabrication will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2326436

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.